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Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.

, , and . IEEE Des. Test Comput., 20 (5): 46-53 (2003)

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Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort., , , and . IEEE Des. Test Comput., 19 (5): 74-81 (2002)Screening MinVDD Outliers Using Feed-Forward Voltage Testing., , , , , , , and . ITC, page 673-682. IEEE Computer Society, (2002)Detection of Temperature Sensitive Defects Using ZTC., , , and . VTS, page 185-192. IEEE Computer Society, (2004)ATE Value Add through Open Data Collection.. ITC, page 1430. IEEE Computer Society, (2004)Impact of Multiple-Detect Test Patterns on Product Quality., , , , , , , and . ITC, page 1031-1040. IEEE Computer Society, (2003)Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs., , , and . VTS, page 39-46. IEEE Computer Society, (2003)Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies., , , and . VTS, page 69-74. IEEE Computer Society, (2002)New test paradigms for yield and manufacturability.. IEEE Des. Test Comput., 22 (3): 240-246 (2005)Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs., , and . IEEE Des. Test Comput., 20 (5): 46-53 (2003)Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data., , , and . ITC, page 1240. IEEE Computer Society, (2002)