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Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology., , , , , , , , and . IRPS, page 6. IEEE, (2022)Demosaicking using inter-channel correlation in wavelet domain., , , and . SIP, page 102-105. IASTED/ACTA Press, (2007)Learning of prototypes and decision boundaries for a verification problem having only positive samples., , and . Pattern Recognit. Lett., 17 (7): 691-697 (1996)Inhibitory Effect of Astaxanthin on Oxidative Stress-Induced Mitochondrial Dysfunction-A Mini-Review, and . Nutrients, (August 2018)A modular factory testbed for the rapid reconfiguration of manufacturing systems., , , , , , , , , and 1 other author(s). J. Intell. Manuf., 31 (3): 661-680 (2020)Nanopattern insert molding, , and . Nanotechnology, 21 (20): 205302 (2010)Relative enhancements of ozone, carbon monoxide, nitrogen dioxide, and aerosols at the Earth's surface during Asian dust episodes in spring., , , , , and . IGARSS, page 3267-3269. IEEE, (2002)Signaling pathway for 2,3,7,8-tetrachlorodibenzo-p-dioxin-induced TNF-alpha production in differentiated THP-1 human macrophages., , , , , , , and . Experimental & molecular medicine, 39 (4): 524--534 (August 2007)Deep neural network Grad-Shafranov solver constrained with measured magnetic signals., , , , , , , , , and . CoRR, (2019)Recognition of logic diagrams by identifying loops and rectilinear polylines., , and . ICDAR, page 349-352. IEEE Computer Society, (1993)