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A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip., , , , , , и . LATS, стр. 1-6. IEEE, (2022)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , и . DDECS, стр. 1-6. IEEE, (2019)A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis., , , , и . Asian Test Symposium, стр. 97-102. IEEE Computer Society, (2001)Optimized embedded memory diagnosis., , , , , , , , и . DDECS, стр. 347-352. IEEE Computer Society, (2011)Adapting to adaptive testing., , , , , , , , и . DATE, стр. 556-561. IEEE Computer Society, (2010)In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip., , , , , и . ITC, стр. 646-649. IEEE, (2022)Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores., , , , , , и . ITC, стр. 379-385. IEEE Computer Society, (2003)A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress., , , , , , , , , и 1 other автор(ы). IEEE Trans. Computers, 72 (5): 1447-1459 (мая 2023)A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , и . IEEE Access, (2023)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC., , , , , , и . J. Electron. Test., 34 (1): 43-52 (2018)