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New Techniques to Reduce the Execution Time of Functional Test Programs., , , и . IEEE Trans. Computers, 66 (7): 1268-1273 (2017)The Use of Model Checking in ATPG for Sequential Circuits., , , и . CAV, том 531 из Lecture Notes in Computer Science, стр. 86-95. Springer, (1990)An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard., , , , , и . LATS, стр. 1-6. IEEE, (2017)Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications., , и . IEEE Access, (2019)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , и . DATE, стр. 115-120. IEEE, (2017)Test-Plan Optimization for Flying-Probes In-Circuit Testers., , , и . ITC-Asia, стр. 19-24. IEEE, (2019)A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks., , , и . IEEE Trans. Computers, 69 (1): 87-98 (2020)Software-Based Self-Test for Transition Faults: a Case Study., , , и . VLSI-SoC, стр. 76-81. IEEE, (2019)An experimental analysis of the effectiveness of the circular self-test path technique., , и . EURO-DAC, стр. 246-251. IEEE Computer Society, (1994)On-line Testing of an Off-the-shelf Microprocessor Board for Safety-critical Applications., , , , , , и . EDCC, том 1150 из Lecture Notes in Computer Science, стр. 190-202. Springer, (1996)