Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , and . VTS, page 1-7. IEEE, (2023)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , and 11 other author(s). IOLTS, page 1-10. IEEE, (2022)SW-based transparent in-field memory testing., , , and . LATS, page 1-6. IEEE Computer Society, (2015)Parallel Multithread Analysis of Extremely Large Simulation Traces., , , , , , and . IEEE Access, (2022)An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis., and . IEEE Trans. Instrum. Meas., 61 (4): 1002-1018 (2012)An Effective Technique for the Automatic Generation of Diagnosis-Oriented Programs for Processor Cores., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (3): 570-574 (2008)Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test., , , , and . J. Electron. Test., 30 (3): 317-328 (2014)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , , and . J. Electron. Test., 20 (1): 79-87 (2004)