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Disambiguation of "Mir, Salvador"

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Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.

, , , , and . J. Electron. Test., 31 (4): 381-394 (2015)

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Mir Ferdowsi

Michael Salvador

Salvador Herrador

Salvador Oberhaus

Salvador Fernandes

 

Other publications of authors with the same name

Analog/RF test ordering in the early stages of production testing., , , and . VTS, page 25-30. IEEE Computer Society, (2012)Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs., , , , and . European Test Symposium, page 1-6. IEEE Computer Society, (2012)Guest Editorial., , and . J. Electron. Test., 22 (4-6): 311 (2006)Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications., , and . J. Electron. Test., 34 (3): 263-279 (2018)A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC., , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 63-I (11): 1876-1888 (2016)Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques., , , , , and . IEEE Des. Test, 33 (6): 46-54 (2016)Evaluation of Analog/RF Test Measurements at the Design Stage., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (4): 582-590 (2009)Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (5): 966-976 (2020)On-Chip Pseudorandom MEMS Testing., , , and . J. Electron. Test., 21 (3): 233-241 (2005)Multivariate statistical techniques for analog parametric test metrics estimation., , , , and . DTIS, page 6-11. IEEE, (2013)