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Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.

A. Dimakos, H. Stratigopoulos, A. Siligaris, S. Mir, and E. de Foucauld. J. Electron. Test., 31 (4): 381-394 (2015)

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Emeric Fontaine

Emeric Baldisser

Foucauld Chamming's

Emeric Guéguen

Emeric Tourniaire

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Design and modelling of a multi-standard fractional PLL in CMOS/SOI technology.G. Jacquemod, L. Geynet, B. Nicolle, E. de Foucauld, W. Tatinian, and P. Vincent. Microelectron. J., 39 (9): 1130-1139 (2008)A power optimized transconductance amplifier and its application to a 6th order lowpass GmC filter.F. Po, E. de Foucauld, D. Morche, P. Vincent, R. Molin, P. Pons, R. Pierquin, and E. Kerherve. ICECS, page 631-634. IEEE, (2009)Novel building blocks for PLL using complementary logic in 28nm UTBB-FDSOI technology.Z. Wei, Y. Leduc, E. de Foucauld, and G. Jacquemod. NEWCAS, page 121-124. IEEE, (2017)A 433-MHz SOI CMOS Automatic Impedance Matching Circuit.E. de Foucauld, R. Severino, D. Nicolas, A. Giry, and C. Delaveaud. IEEE Trans. Circuits Syst. II Express Briefs, 66-II (6): 958-962 (2019)A frequency measurement BIST implementation targeting gigahertz application.M. Dubois, E. de Foucauld, C. Mounet, S. Dia, and C. Mayor. ITC, page 1-8. IEEE Computer Society, (2012)Robust BER estimator for DBPSK modulation.T. Bonnoit, D. Morche, C. Dehos, and E. de Foucauld. NEWCAS, page 153-156. IEEE, (2014)UTBB-FDSOI complementary logic for high quality analog signal processing.Z. Wei, Y. Leduc, G. Jacquemod, and E. de Foucauld. ICECS, page 572-575. IEEE, (2016)New design of analog and mixed-signal cells using back-gate cross-coupled structure.G. Jacquemod, Z. Wei, Y. Leduc, E. de Foucauld, J. Prouvée, and B. Blampey. VLSI-SoC, page 21-26. IEEE, (2019)Design of a RF matching network based on a new tunable inductor concept.M. Bakkali, F. Po, E. de Foucauld, B. Viala, and J. Michel. Microelectron. J., 42 (1): 233-238 (2011)An Ultra Low Power SoC for 2.4GHz IEEE802.15.4 wireless communications.C. Bernier, F. Hameau, G. Billiot, E. de Foucauld, S. Robinet, D. Lattard, J. Durupt, F. Dehmas, L. Ouvry, and P. Vincent. ESSCIRC, page 426-429. IEEE, (2008)

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Disambiguation of "de Foucauld, Emeric"

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Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.

Please choose a person to relate this publication to

Emeric Fontaine

Emeric Baldisser

Foucauld Chamming's

Emeric Guéguen

Emeric Tourniaire

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "de Foucauld, Emeric"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.

Please choose a person to relate this publication to

Emeric Fontaine

Emeric Baldisser

Foucauld Chamming's

Emeric Guéguen

Emeric Tourniaire

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.