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Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis.

T. Inamoto, and Y. Higami. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 103-A (12): 1456-1463 (2020)

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Yoshinobu Kumazawa

Other publications of authors with the same name

On the fault diagnosis in the presence of unknown fault models using pass/fail information.T. Seiyama, H. Takahashi, Y. Higami, K. Yamazaki, and Y. Takamatsu. ISCAS (3), page 2987-2990. IEEE, (2005)Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits.Y. Higami, K. Saluja, H. Takahashi, S. ya Kobayashi, and Y. Takamatsu. ASP-DAC, page 659-664. IEEE, (2006)Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors.Y. Higami, K. Saluja, H. Takahashi, S. ya Kobayashi, and Y. Takamatsu. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 91-A (12): 3506-3513 (2008)On selection of adjacent lines in test pattern generation for delay faults considering crosstalk effects.Y. Ohama, H. Yotsuyanagi, M. Hashizume, Y. Higami, and H. Takahashi. ISCIT, page 1-5. IEEE, (2017)Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines.H. Yotsuyanagi, K. Ise, M. Hashizume, Y. Higami, and H. Takahashi. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 100-A (12): 2842-2850 (2017)Test cost reduction for logic circuits: Reduction of test data volume and test application time.Y. Higami, S. Kajihara, H. Ichihara, and Y. Takamatsu. Syst. Comput. Jpn., 36 (6): 69-83 (2005)Comparative Evaluation of Bluetooth and Wi-Fi Direct for Tablet-Oriented Educational Applications.K. Endo, A. Onoyama, D. Okano, Y. Higami, and S. ya Kobayashi. ACIIDS (1), volume 10191 of Lecture Notes in Computer Science, page 345-354. (2017)Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis.T. Inamoto, and Y. Higami. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 103-A (12): 1456-1463 (2020)On Detecting Transition Faults in the Presence of Clock Delay Faults.Y. Higami, H. Takahashi, S. ya Kobayashi, and K. Saluja. Asian Test Symposium, page 1-6. IEEE Computer Society, (2011)Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits.H. Takahashi, M. Phadoongsidhi, Y. Higami, K. Saluja, and Y. Takamatsu. Asian Test Symposium, page 63-. IEEE Computer Society, (2001)

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Disambiguation of "Higami, Yoshinobu"

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Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis.

Please choose a person to relate this publication to

Yoshinobu Kumazawa

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Higami, Yoshinobu"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis.

Please choose a person to relate this publication to

Yoshinobu Kumazawa

Other publications of authors with the same name

Disambiguation

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URL
DOI
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Chicago
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Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis.