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HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors.

R. Huang, R. Wang, C. Liu, L. Zhang, J. Zhuge, Y. Tao, J. Zou, Y. Liu, и Y. Wang. Microelectron. Reliab., 51 (9-11): 1515-1520 (2011)

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Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylationL. Wang. Uni Marburg, (2009)

Xiangdong Wang

Bingjun Wang

Xiqu Wang

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