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Test Time and Area Optimized BrST Scheme for Automotive ICs.

N. Mukherjee, J. Tyszer, D. Tille, M. Sapati, Y. Liu, J. Mayer, S. Milewski, E. Moghaddam, J. Rajski, and J. Solecki. ITC, page 1-10. IEEE, (2019)

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Jedrzej Ratajczak

Jedrzej Kufel

Roman Solecki

Dieter Solecki

Jedrzej Hoffmann

Other publications of authors with the same name

TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm.G. Mrugalski, J. Rajski, J. Solecki, J. Tyszer, and C. Wang. ATS, page 19-24. IEEE Computer Society, (2015)Diagnosis of Failing Scan Cells through Orthogonal Response Compaction.B. Benware, G. Mrugalski, A. Pogiel, J. Rajski, J. Solecki, and J. Tyszer. ETS, page 1-6. IEEE Computer Society, (2011)Time and Area Optimized Testing of Automotive ICs.N. Mukherjee, D. Tille, M. Sapati, Y. Liu, J. Mayer, S. Milewski, E. Moghaddam, J. Rajski, J. Solecki, and J. Tyszer. IEEE Trans. Very Large Scale Integr. Syst., 29 (1): 76-88 (2021)Test Time and Area Optimized BrST Scheme for Automotive ICs.N. Mukherjee, J. Tyszer, D. Tille, M. Sapati, Y. Liu, J. Mayer, S. Milewski, E. Moghaddam, J. Rajski, and J. Solecki. ITC, page 1-10. IEEE, (2019)Diagnosis of failing scan cells through orthogonal response compaction.B. Benware, G. Mrugalski, A. Pogiel, J. Rajski, J. Solecki, and J. Tyszer. European Test Symposium, page 221-226. IEEE Computer Society, (2010)Full-scan LBIST with capture-per-cycle hybrid test points.S. Milewski, N. Mukherjee, J. Rajski, J. Solecki, J. Tyszer, and J. Zawada. ITC, page 1-9. IEEE, (2017)Low-Power Programmable PRPG With Test Compression Capabilities.M. Filipek, G. Mrugalski, N. Mukherjee, B. Nadeau-Dostie, J. Rajski, J. Solecki, and J. Tyszer. IEEE Trans. Very Large Scale Integr. Syst., 23 (6): 1063-1076 (2015)Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.B. Benware, G. Mrugalski, A. Pogiel, J. Rajski, J. Solecki, and J. Tyszer. J. Electron. Test., 27 (5): 599-609 (2011)Low power programmable PRPG with enhanced fault coverage gradient.J. Solecki, J. Tyszer, G. Mrugalski, N. Mukherjee, and J. Rajski. ITC, page 1-9. IEEE Computer Society, (2012)Trimodal Scan-Based Test Paradigm.G. Mrugalski, J. Rajski, J. Solecki, J. Tyszer, and C. Wang. IEEE Trans. Very Large Scale Integr. Syst., 25 (3): 1112-1125 (2017)

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Disambiguation of "Solecki, Jedrzej"

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Test Time and Area Optimized BrST Scheme for Automotive ICs.

Please choose a person to relate this publication to

Jedrzej Ratajczak

Jedrzej Kufel

Roman Solecki

Dieter Solecki

Jedrzej Hoffmann

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Solecki, Jedrzej"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Test Time and Area Optimized BrST Scheme for Automotive ICs.

Please choose a person to relate this publication to

Jedrzej Ratajczak

Jedrzej Kufel

Roman Solecki

Dieter Solecki

Jedrzej Hoffmann

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Test Time and Area Optimized BrST Scheme for Automotive ICs.