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Multilevel operation in oxide based resistive RAM with SET voltage modulation., , , , , и . DTIS, стр. 1-5. IEEE, (2016)New implementions of predictive alternate analog/RF test with augmented model redundancy., , , , , и . DATE, стр. 1-4. European Design and Automation Association, (2014)Smart selection of indirect parameters for DC-based alternate RF IC testing., , , , , , , и . VTS, стр. 19-24. IEEE Computer Society, (2012)Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability., , , , , и . DFT, стр. 81-85. IEEE Computer Society, (2014)Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements., , , , , и . Microelectron. J., 45 (3): 336-344 (2014)Making predictive analog/RF alternate test strategy independent of training set size., , , , , , и . ITC, стр. 1-9. IEEE Computer Society, (2012)Implementing model redundancy in predictive alternate test to improve test confidence., , , , , , и . ETS, стр. 1. IEEE Computer Society, (2013)