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Trimodal Scan-Based Test Paradigm., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 25 (3): 1112-1125 (2017)X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (1): 147-159 (2008)On Compaction Utilizing Inter and Intra-Correlation of Unknown States., , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (1): 117-126 (2010)X-Press Compactor for 1000x Reduction of Test Data., , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2006)Dynamic channel allocation for higher EDT compression in SoC designs., , , , , и . ITC, стр. 265-274. IEEE Computer Society, (2010)A deterministic BIST scheme based on EDT-compressed test patterns., , , , и . ITC, стр. 1-8. IEEE, (2015)EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism., , , , , , и . ITC, стр. 1-9. IEEE Computer Society, (2011)Low Power Decompressor and PRPG with Constant Value Broadcast., , , , , , и . Asian Test Symposium, стр. 84-89. IEEE Computer Society, (2011)On Cyclic Scan Integrity Tests for EDT-based Compression., , , , и . VTS, стр. 1-6. IEEE, (2019)Highly X-Tolerant Selective Compaction of Test Responses., , , , и . VTS, стр. 245-250. IEEE Computer Society, (2009)