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Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors.

, , , , , , , и . OFC, стр. 1-3. IEEE, (2022)

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Nicolas Roussel

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Martin Roussel

Philippe Kersting

Philippe Bopp

 

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Editing First-Order Proofs: Programmed Rules vs Derived Rules., , и . SLP, стр. 92-98. IEEE-CS, (1984)Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies., , , , , , , , , и 6 other автор(ы). ESSDERC, стр. 102-105. IEEE, (2014)Estimation des titres viraux : une programmation pratique et fiable sur calculatrice de poche, et accessible par l'Internet., и . Monde des Util. Anal. Données, (2006)Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point., , , , и . ERMAVSS@DATE, том 1566 из CEUR Workshop Proceedings, стр. 13-16. CEUR-WS.org, (2016)Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors., , , , , , , и . OFC, стр. 1-3. IEEE, (2022)Variability aware modeling for yield enhancement of SRAM and logic., , , и . DATE, стр. 1153-1158. IEEE, (2011)Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements., , , , , , , , , и . VLSI Technology and Circuits, стр. 340-342. IEEE, (2022)Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations., , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 27 (3): 601-610 (2019)Defect-centric perspective of time-dependent BTI variability., , , , , и . Microelectron. Reliab., 52 (9-10): 1883-1890 (2012)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , и 4 other автор(ы). Microelectron. Reliab., (2018)