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Disambiguation of "Suñé, Jordi"

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Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition.

, , , , , and . LASCAS, page 1-4. IEEE, (2021)

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Alexander Jording

Guido Jordine

Jordi Serangeli

Jordi Serratosa

Ulrich Jordi

 

Other publications of authors with the same name

Equivalent circuit modeling of the bistable conduction characteristics in electroformed thin dielectric films., , , , and . Microelectron. Reliab., 55 (1): 1-14 (2015)Voltage-Driven Hysteresis Model for Resistive Switching: SPICE Modeling and Circuit Applications., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2044-2051 (2017)Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition., , , , and . IEEE Access, (2020)Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates., , , , and . Microelectron. Reliab., 55 (9-10): 1442-1445 (2015)Field-effect control of breakdown paths in HfO2 based MIM structures., , , , , , and . Microelectron. Reliab., 53 (9-11): 1346-1350 (2013)Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition., , , , , and . LASCAS, page 1-4. IEEE, (2021)Equivalent circuit model for the electron transport in 2D resistive switching material systems., , , , , and . ESSDERC, page 86-89. IEEE, (2017)Statistics of soft and hard breakdown in thin SiO2 gate oxides., , , and . Microelectron. Reliab., 43 (8): 1185-1192 (2003)Direct observation of the generation of breakdown spots in MIM structures under constant voltage stress., , , , and . Microelectron. Reliab., 53 (9-11): 1257-1260 (2013)Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors., , , , , , , , , and . Microelectron. Reliab., 54 (9-10): 1707-1711 (2014)