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On Totally Self-Checking Checkers for Separable Codes.

, and . IEEE Trans. Computers, 26 (8): 737-744 (1977)

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Layout Resynthesis by Applying Design-for-manufacturability Guidelines to Avoid Low-coverage Areas of a Cell-based Design., , , , and . ACM Trans. Design Autom. Electr. Syst., 24 (4): 42:1-42:19 (2019)Correcting Unidirectional Errors with Nonpositive Hopfield Networks., , and . ICNN, page 2933-2938. IEEE, (1995)Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines., , , , and . DATE, page 1022-1027. IEEE, (2019)Selection of a fault model for fault diagnosis based on unique responses., and . DATE, page 994-999. IEEE, (2009)Test Generation for Synchronous Sequential Circuits Using Multiple Observation Times., and . FTCS, page 52-59. IEEE Computer Society, (1991)EXOP (Extended Operation): A New Logical Fault Model for Digital Circuits., and . FTCS, page 166-175. IEEE Computer Society, (1993)Synthesis of Multi-Level Combinational Circuits for Complete Robust Path Delay Fault Testability., , , and . FTCS, page 280-287. IEEE Computer Society, (1992)On the design of robust testable CMOS combinational logic circuits., and . FTCS, page 220-225. IEEE Computer Society, (1988)A supervised machine learning application in volume diagnosis., , , , , , and . ETS, page 1-6. IEEE, (2019)Volume diagnosis data mining., , and . ETS, page 1-10. IEEE, (2017)