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Disambiguation of "Pan, Renjian"

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Fine-Grained Adaptive Testing Based on Quality Prediction.

, , , , , and . ITC, page 1-10. IEEE, (2018)

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Renjian Wang

Xiaoqing Pan

Petra Pan

Pan Li

Yaling Pan

 

Other publications of authors with the same name

Analog/RF Post-silicon Tuning via Bayesian Optimization., , , , , and . ACM Trans. Design Autom. Electr. Syst., 25 (1): 7:1-7:17 (2020)Applying Machine Learning to Testing and Diagnosis of Integrated Systems.. Duke University, Durham, NC, USA, (2021)base-search.net (ftdukeunivdsp:oai:localhost:10161/24395).Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems., , and . VTS, page 1-6. IEEE, (2021)Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems., , and . VTS, page 1-7. IEEE, (2022)Unsupervised Root-Cause Analysis for Integrated Systems., , , , and . ITC, page 1-10. IEEE, (2020)Black-Box Test-Cost Reduction Based on Bayesian Network Models., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (2): 386-399 (2021)Fine-grained Adaptive Testing Based on Quality Prediction., , , , , and . ACM Trans. Design Autom. Electr. Syst., 25 (5): 38:1-38:25 (2020)Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (2): 497-508 (February 2023)Fine-Grained Adaptive Testing Based on Quality Prediction., , , , , and . ITC, page 1-10. IEEE, (2018)Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model., , , , and . VTS, page 1-6. IEEE, (2019)