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Disambiguation of "Ichimiya, Masahiro"

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Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.

, , , , and . DELTA, page 387-391. IEEE Computer Society, (2002)

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Masahiro Noguchi

Masahiro Ogawa

Masahiro Yoshida

Masahiro Katsura

Masahiro Niitsuma

 

Other publications of authors with the same name

A test circuit for pin shorts generating oscillation in CMOS logic circuits., , , and . Syst. Comput. Jpn., 35 (13): 10-20 (2004)CMOS open defect detection by supply current test., , , and . DATE, page 509. IEEE Computer Society, (2001)Electric field for detecting open leads in CMOS logic circuits by supply current testing., , , and . ISCAS (3), page 2995-2998. IEEE, (2005)Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field., , , , and . DELTA, page 387-391. IEEE Computer Society, (2002)A High-Speed IDDQ Sensor for Low-Voltage ICs., , , , and . Asian Test Symposium, page 327-. IEEE Computer Society, (1998)IDDQ Sensing Technique for High Speed IDDQ Testing., , , , , and . Asian Test Symposium, page 111-116. IEEE Computer Society, (2001)CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application., , , and . Asian Test Symposium, page 117-122. IEEE Computer Society, (2001)High speed IDDQ test and its testability for process variation., , , , and . Asian Test Symposium, page 344-349. IEEE Computer Society, (2000)Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field., , , , and . DFT, page 287-. IEEE Computer Society, (2001)