A. Milenkoski, K. Jayaram, N. Antunes, M. Vieira, und S. Kounev. Proceedings of The 27th IEEE International Symposium on Software Reliability Engineering (ISSRE 2016), Washington DC, USA, IEEE, IEEE Computer Society, (Oktober 2016)Acceptance rate (Full Paper): 45/130 = 34\%.
A. Milenkoski, K. Jayaram, N. Antunes, M. Vieira, und S. Kounev. Proceedings of The 27th IEEE International Symposium on Software Reliability Engineering (ISSRE 2016), Washington DC, USA, IEEE, IEEE Computer Society, (Oktober 2016)Acceptance rate (Full Paper): 45/130 = 34\%.