P. R, K. M, M. H, K. Venugopal, and L. Patnaik. International Journal of Innovative Science and Modern Engineering (IJISME), 3 (2):
67-74(January 2015)
A. Milenkoski, K. Jayaram, N. Antunes, M. Vieira, and S. Kounev. Proceedings of The 27th IEEE International Symposium on Software Reliability Engineering (ISSRE 2016), Washington DC, USA, IEEE, IEEE Computer Society, (October 2016)Acceptance rate (Full Paper): 45/130 = 34\%.
A. Milenkoski, K. Jayaram, N. Antunes, M. Vieira, and S. Kounev. Proceedings of The 27th IEEE International Symposium on Software Reliability Engineering (ISSRE 2016), Washington DC, USA, IEEE, IEEE Computer Society, (October 2016)Acceptance rate (Full Paper): 45/130 = 34\%.