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%0 Journal Article
%1 journals/mr/LazarTLMR15
%A Lazar, O.
%A Tartarin, Jean-Guy
%A Lambert, Benoit
%A Moreau, C.
%A Roux, J.-L.
%D 2015
%J Microelectron. Reliab.
%K dblp
%N 9-10
%P 1714-1718
%T Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies.
%U http://dblp.uni-trier.de/db/journals/mr/mr55.html#LazarTLMR15
%V 55
@article{journals/mr/LazarTLMR15,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Lazar, O. and Tartarin, Jean-Guy and Lambert, Benoit and Moreau, C. and Roux, J.-L.},
biburl = {https://www.bibsonomy.org/bibtex/22de3b563ee39b50b7331b1c3e6db6e1a/dblp},
ee = {https://doi.org/10.1016/j.microrel.2015.06.122},
interhash = {059d8405c0c8976173541c2736945427},
intrahash = {2de3b563ee39b50b7331b1c3e6db6e1a},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-10},
pages = {1714-1718},
timestamp = {2020-02-25T13:22:55.000+0100},
title = {Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#LazarTLMR15},
volume = 55,
year = 2015
}