%0 Journal Article %1 journals/mr/LazarTLMR15 %A Lazar, O. %A Tartarin, Jean-Guy %A Lambert, Benoit %A Moreau, C. %A Roux, J.-L. %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1714-1718 %T Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#LazarTLMR15 %V 55

@article{journals/mr/LazarTLMR15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lazar, O. and Tartarin, Jean-Guy and Lambert, Benoit and Moreau, C. and Roux, J.-L.}, biburl = {https://www.bibsonomy.org/bibtex/22de3b563ee39b50b7331b1c3e6db6e1a/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.122}, interhash = {059d8405c0c8976173541c2736945427}, intrahash = {2de3b563ee39b50b7331b1c3e6db6e1a}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1714-1718}, timestamp = {2020-02-25T13:22:55.000+0100}, title = {Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#LazarTLMR15}, volume = 55, year = 2015 }