%0 Conference Paper %1 conf/dft/Aikyo10 %A Aikyo, Takashi %B DFT %D 2010 %I IEEE Computer Society %K dblp %P 227 %T Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau. %U http://dblp.uni-trier.de/db/conf/dft/dft2010.html#Aikyo10 %@ 978-1-4244-8447-8

@inproceedings{conf/dft/Aikyo10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Aikyo, Takashi}, biburl = {https://www.bibsonomy.org/bibtex/2d81c754c5434948f0c0f0d0749456df3/dblp}, booktitle = {DFT}, crossref = {conf/dft/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2010.34}, interhash = {2dc84c31f21a5f3711d46d65db585b5d}, intrahash = {d81c754c5434948f0c0f0d0749456df3}, isbn = {978-1-4244-8447-8}, keywords = {dblp}, pages = 227, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:37.000+0200}, title = {Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2010.html#Aikyo10}, year = 2010 }