%0 Conference Paper %1 conf/irps/LiuIKMN22 %A Liu, Wen %A Ioannou, Dimitris P. %A Kantarovsky, Johnatan %A Min, Byoung %A Nigam, Tanya %B IRPS %D 2022 %I IEEE %K dblp %P 26-1 %T Robust Off-State TDDB Reliability of n-LDMOS. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LiuIKMN22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/LiuIKMN22, added-at = {2022-05-09T00:00:00.000+0200}, author = {Liu, Wen and Ioannou, Dimitris P. and Kantarovsky, Johnatan and Min, Byoung and Nigam, Tanya}, biburl = {https://www.bibsonomy.org/bibtex/2bf12f03bcf4e5ce9e516e345e0daf240/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764573}, interhash = {3a562d0abce319606c15c6f0d3a5e328}, intrahash = {bf12f03bcf4e5ce9e516e345e0daf240}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = {26-1}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Robust Off-State TDDB Reliability of n-LDMOS.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LiuIKMN22}, year = 2022 }