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RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications., , , , , , , , , and 5 other author(s). IRPS, page 1-6. IEEE, (2023)Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications., , , , , , , , , and 1 other author(s). IRPS, page 1-5. IEEE, (2020)Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability., , , , , , , and . IRPS, page 5. IEEE, (2022)Robust Off-State TDDB Reliability of n-LDMOS., , , , and . IRPS, page 26-1. IEEE, (2022)Increasing Microprocessor Speed by Massive Application of On-Die High-K MIM Decoupling Capacitors., , , , , , , , , and 1 other author(s). ISSCC, page 2190-2199. IEEE, (2006)Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics., , , , and . OFC, page 1-3. IEEE, (2020)A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications., , , , , and . IRPS, page 1-4. IEEE, (2020)RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications., , , , , , , , , and 3 other author(s). IRPS, page 1-6. IEEE, (2021)Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area., , , , , , , and . IRPS, page 1-6. IEEE, (2021)Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs., , , , , , , , , and 1 other author(s). IRPS, page 1-6. IEEE, (2019)