( en | de | ru )

 

Disambiguation of "Nigam, Tanya"

Author of the publication

copydeleteadd this publication to your clipboard
Robust Off-State TDDB Reliability of n-LDMOS.

, , , , and . IRPS, page 26-1. IEEE, (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Tanya Lambert

Santosh Nigam

Tanya Faude

Tanya Todorova

Tanya Steiger

 

Other publications of authors with the same name

Optimized LDMOS Offering for Power Management and RF Applications., , , , , , , , , and 5 other author(s). IRPS, page 57-1. IEEE, (2022)Reliability modeling of HK MG technologies., and . CICC, page 1-8. IEEE, (2014)CMOS reliability: From discrete device degradation to circuit aging.. VLSI-DAT, page 1. IEEE, (2013)Self-heating characterization and its applications in technology development., , , , , , , , , and 8 other author(s). NATW, page 1-7. IEEE, (2020)A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology., , , , , , , and . IRPS, page 1-5. IEEE, (2020)Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing., , , , , , , , , and 3 other author(s). IRPS, page 6. IEEE, (2015)Understanding gate metal work function (mWF) impact on device reliability - A holistic approach., , , , , , , , and . IRPS, page 6. IEEE, (2018)Robust Off-State TDDB Reliability of n-LDMOS., , , , and . IRPS, page 26-1. IEEE, (2022)HTOL SRAM Vmin shift considerations in scaled HKMG technologies., , , , , , , , , and 2 other author(s). CICC, page 1-4. IEEE, (2014)Impact of Transistor Level degradation on product reliability.. CICC, page 431-438. IEEE, (2009)