%0 Conference Paper %1 conf/irps/VandendaeleLLJVGMNCI23 %A Vandendaele, William %A Leurquin, Camille %A Lavieville, R. %A Jaud, Marie-Anne %A Viey, Abygaël %A Gwoziecki, Romain %A Mohamad, B. %A Nowak, Etienne %A Constant, Aurore %A Iucolano, Ferdinando %B IRPS %D 2023 %I IEEE %K dblp %P 1-8 %T Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited). %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#VandendaeleLLJVGMNCI23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/VandendaeleLLJVGMNCI23, added-at = {2024-07-08T00:00:00.000+0200}, author = {Vandendaele, William and Leurquin, Camille and Lavieville, R. and Jaud, Marie-Anne and Viey, Abygaël and Gwoziecki, Romain and Mohamad, B. and Nowak, Etienne and Constant, Aurore and Iucolano, Ferdinando}, biburl = {https://www.bibsonomy.org/bibtex/2986d6ada89498d20c33248388bc71356/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10118180}, interhash = {434ca08409b2752648071b30addc7af5}, intrahash = {986d6ada89498d20c33248388bc71356}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE}, timestamp = {2024-07-15T07:17:46.000+0200}, title = {Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited).}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#VandendaeleLLJVGMNCI23}, year = 2023 }