Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/irps/ReganazDRLCNBPMA23
%A Reganaz, Lucas
%A Deleruyelle, Damien
%A Rafhay, Quentin
%A Lopez, Joel Minguet
%A Castellani, Niccolo
%A Nodin, Jean-François
%A Bricalli, Alessandro
%A Piccolboni, Giuseppe
%A Molas, Gabriel
%A Andrieu, François
%B IRPS
%D 2023
%I IEEE
%K dblp
%P 1-6
%T Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability.
%U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#ReganazDRLCNBPMA23
%@ 978-1-6654-5672-2
@inproceedings{conf/irps/ReganazDRLCNBPMA23,
added-at = {2023-08-29T00:00:00.000+0200},
author = {Reganaz, Lucas and Deleruyelle, Damien and Rafhay, Quentin and Lopez, Joel Minguet and Castellani, Niccolo and Nodin, Jean-François and Bricalli, Alessandro and Piccolboni, Giuseppe and Molas, Gabriel and Andrieu, François},
biburl = {https://www.bibsonomy.org/bibtex/29e349a366ef57c7629e36240d542d7b8/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2023},
ee = {https://doi.org/10.1109/IRPS48203.2023.10117882},
interhash = {436324e995ef21efaa1c780560101783},
intrahash = {9e349a366ef57c7629e36240d542d7b8},
isbn = {978-1-6654-5672-2},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-09T12:18:52.000+0200},
title = {Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#ReganazDRLCNBPMA23},
year = 2023
}