%0 Journal Article %1 journals/et/KimKH08 %A Kim, Hong-Sik %A Kang, Sungho %A Hsiao, Michael S. %D 2008 %J J. Electron. Test. %K dblp %N 4 %P 365-378 %T A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. %U http://dblp.uni-trier.de/db/journals/et/et24.html#KimKH08 %V 24

@article{journals/et/KimKH08, added-at = {2024-02-27T00:00:00.000+0100}, author = {Kim, Hong-Sik and Kang, Sungho and Hsiao, Michael S.}, biburl = {https://www.bibsonomy.org/bibtex/24b1326dec973ef3bbcab98b5efc1d841/dblp}, ee = {https://doi.org/10.1007/s10836-008-5062-6}, interhash = {4cbc46c90092661f0cc662e91c675b6e}, intrahash = {4b1326dec973ef3bbcab98b5efc1d841}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 4, pages = {365-378}, timestamp = {2024-04-08T20:52:34.000+0200}, title = {A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.}, url = {http://dblp.uni-trier.de/db/journals/et/et24.html#KimKH08}, volume = 24, year = 2008 }