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%0 Journal Article
%1 journals/et/KimKH08
%A Kim, Hong-Sik
%A Kang, Sungho
%A Hsiao, Michael S.
%D 2008
%J J. Electron. Test.
%K dblp
%N 4
%P 365-378
%T A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.
%U http://dblp.uni-trier.de/db/journals/et/et24.html#KimKH08
%V 24
@article{journals/et/KimKH08,
added-at = {2024-02-27T00:00:00.000+0100},
author = {Kim, Hong-Sik and Kang, Sungho and Hsiao, Michael S.},
biburl = {https://www.bibsonomy.org/bibtex/24b1326dec973ef3bbcab98b5efc1d841/dblp},
ee = {https://doi.org/10.1007/s10836-008-5062-6},
interhash = {4cbc46c90092661f0cc662e91c675b6e},
intrahash = {4b1326dec973ef3bbcab98b5efc1d841},
journal = {J. Electron. Test.},
keywords = {dblp},
number = 4,
pages = {365-378},
timestamp = {2024-04-08T20:52:34.000+0200},
title = {A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.},
url = {http://dblp.uni-trier.de/db/journals/et/et24.html#KimKH08},
volume = 24,
year = 2008
}