Author of the publication

A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.

, , and . J. Electron. Test., 24 (4): 365-378 (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Hybrid Rule-based and Machine Learning System for Assertion Generation from Natural Language Specifications., and . ATS, page 126-131. IEEE, (2022)Mining Sequential Constraints for Pseudo-Functional Testing., and . ATS, page 19-24. IEEE, (2007)Multiplexed trace signal selection using non-trivial implication-based correlation., and . ISQED, page 697-704. IEEE, (2010)Fast Static Compaction Algorithms for Sequential Circuit Test Vectors., , and . IEEE Trans. Computers, 48 (3): 311-322 (1999)State Variable Extraction and Partitioning to Reduce Problem Complexity for ATPG and Design Validation., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (10): 2275-2282 (2006)Bilateral Testing of Nano-scale Fault-Tolerant Circuits., and . J. Electron. Test., 24 (1-3): 285-296 (2008)Efficient techniques for transition testing., , , and . ACM Trans. Design Autom. Electr. Syst., 10 (2): 258-278 (2005)A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults., , and . ACM Great Lakes Symposium on VLSI, page 455-458. ACM, (2017)SAT-based equivalence checking of threshold logic designs for nanotechnologies., , and . ACM Great Lakes Symposium on VLSI, page 225-230. ACM, (2008)Branch guided functional test generation at the RTL., , and . ETS, page 1-6. IEEE, (2015)