%0 Journal Article %1 journals/dt/AbadirPBSD94 %A Abadir, Magdy S. %A Parikh, Ashish R. %A Bal, Linda %A Sandborn, Peter %A Drake, Ken %D 1994 %J IEEE Des. Test Comput. %K dblp %N 1 %P 40-52 %T Analyzing Multichip Module Testing Strategies. %U http://dblp.uni-trier.de/db/journals/dt/dt11.html#AbadirPBSD94 %V 11

@article{journals/dt/AbadirPBSD94, added-at = {2020-05-17T00:00:00.000+0200}, author = {Abadir, Magdy S. and Parikh, Ashish R. and Bal, Linda and Sandborn, Peter and Drake, Ken}, biburl = {https://www.bibsonomy.org/bibtex/2f3348bdb6103cf054196950e9b481441/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/54.262321}, interhash = {16bb623168ed35ad36d5a1586be50df1}, intrahash = {f3348bdb6103cf054196950e9b481441}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 1, pages = {40-52}, timestamp = {2020-05-19T12:19:25.000+0200}, title = {Analyzing Multichip Module Testing Strategies.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt11.html#AbadirPBSD94}, volume = 11, year = 1994 }