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Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die., , and . J. Electron. Test., 10 (1-2): 151-166 (1997)Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly., and . J. Electron. Test., 22 (1): 49-60 (2006)Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics., , , , , and . Microelectron. Reliab., 47 (12): 1857-1864 (2007)A Methodology for Determining the Return on Investment Associated With Prognostics and Health Management., , and . IEEE Trans. Reliability, 58 (2): 305-316 (2009)A detailed cost model for concurrent use with hardware/software co-design., , and . DAC, page 269-274. ACM, (2002)A part total cost of ownership model for long life cycle electronic systems., and . Int. J. Computer Integrated Manufacturing, 25 (4-5): 384-397 (2012)Process capability indices and product reliability., , and . Microelectron. Reliab., 41 (12): 2067-2070 (2001)High Level Test Economics Advisor (Hi-TEA)., , , , and . J. Electron. Test., 5 (2-3): 195-206 (1994)PHM based predictive maintenance optimization for offshore wind farms., , , , and . ICPHM, page 1-8. IEEE, (2015)Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms., and . ITC, page 937-946. IEEE Computer Society, (2003)