Inproceedings,
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing.
L. Wu, S. Rao, G. Medeiros, M. Taouil, E. Marinissen, F. Yasin, S. Couet, S. Hamdioui, and G. Kar.ETS, page 1-6. IEEE, (2019)
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- conf/ets/WuRMTMYCHK19
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- inproceedings
- booktitle
- ETS
- year
- 2019
- pages
- 1-6
- publisher
- IEEE
- crossref
- conf/ets/2019
- ee
- https://doi.org/10.1109/ETS.2019.8791518
- isbn
- 978-1-7281-1173-5
- url
- http://dblp.uni-trier.de/db/conf/ets/ets2019.html#WuRMTMYCHK19
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%1 conf/ets/WuRMTMYCHK19
%A Wu, Lizhou
%A Rao, Siddharth
%A Medeiros, Guilherme Cardoso
%A Taouil, Mottaqiallah
%A Marinissen, Erik Jan
%A Yasin, Farrukh
%A Couet, Sebastien
%A Hamdioui, Said
%A Kar, Gouri Sankar
%B ETS
%D 2019
%I IEEE
%K dblp
%P 1-6
%T Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing.
%U http://dblp.uni-trier.de/db/conf/ets/ets2019.html#WuRMTMYCHK19
%@ 978-1-7281-1173-5
@inproceedings{conf/ets/WuRMTMYCHK19,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Wu, Lizhou and Rao, Siddharth and Medeiros, Guilherme Cardoso and Taouil, Mottaqiallah and Marinissen, Erik Jan and Yasin, Farrukh and Couet, Sebastien and Hamdioui, Said and Kar, Gouri Sankar},
biburl = {https://www.bibsonomy.org/bibtex/2e6ad670f69ef7e9f37cf081129a2661d/dblp},
booktitle = {ETS},
crossref = {conf/ets/2019},
ee = {https://doi.org/10.1109/ETS.2019.8791518},
interhash = {80972c6d2f6b7379856ec1563c6ad8a0},
intrahash = {e6ad670f69ef7e9f37cf081129a2661d},
isbn = {978-1-7281-1173-5},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-05-13T10:05:03.000+0200},
title = {Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2019.html#WuRMTMYCHK19},
year = 2019
}