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Applying Thermal Side-Channel Attacks on Asymmetric Cryptography., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 29 (11): 1930-1942 (2021)A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs., , , , , , and . DATE, page 792-797. IEEE, (2020)RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems., , , , , , , , , and 8 other author(s). CoRR, (2019)Characterization and Test of Intermittent Over RESET in RRAMs., , , , , , , , and . ATS, page 1-6. IEEE, (2023)Memristor-Based Lightweight Encryption., , , , , , and . DSD, page 634-641. IEEE, (2023)Memristive devices for computation-in-memory., , , , and . DATE, page 1646-1651. IEEE, (2018)Smart Redundancy Schemes for ANNs Against Fault Attacks., , and . ETS, page 1-2. IEEE, (2022)Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks., , , and . PST, page 1-10. IEEE, (2021)Structured Test Development Approach for Computation-in-Memory Architectures., , and . ITC-Asia, page 61-66. IEEE, (2022)Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions., , , , , and . ITC, page 143-152. IEEE, (2021)