%0 Conference Paper %1 conf/ats/AouichiYFRKMCTH23 %A Aouichi, Ahmed %A Yuan, Sicong %A Fieback, Moritz %A Rao, Siddharth %A Kim, Woojin %A Marinissen, Erik Jan %A Couet, Sebastien %A Taouil, Mottaqiallah %A Hamdioui, Said %B ATS %D 2023 %I IEEE %K dblp %P 1-6 %T Device Aware Diagnosis for Unique Defects in STT-MRAMs. %U http://dblp.uni-trier.de/db/conf/ats/ats2023.html#AouichiYFRKMCTH23 %@ 979-8-3503-0310-0

@inproceedings{conf/ats/AouichiYFRKMCTH23, added-at = {2024-02-05T00:00:00.000+0100}, author = {Aouichi, Ahmed and Yuan, Sicong and Fieback, Moritz and Rao, Siddharth and Kim, Woojin and Marinissen, Erik Jan and Couet, Sebastien and Taouil, Mottaqiallah and Hamdioui, Said}, biburl = {https://www.bibsonomy.org/bibtex/28a2b4324cb9df2d9f6d3613b71f2cf12/dblp}, booktitle = {ATS}, crossref = {conf/ats/2023}, ee = {https://doi.org/10.1109/ATS59501.2023.10317952}, interhash = {8acc1880fd7104288f790c005ba494e5}, intrahash = {8a2b4324cb9df2d9f6d3613b71f2cf12}, isbn = {979-8-3503-0310-0}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T14:13:57.000+0200}, title = {Device Aware Diagnosis for Unique Defects in STT-MRAMs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2023.html#AouichiYFRKMCTH23}, year = 2023 }