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Device Aware Diagnosis for Unique Defects in STT-MRAMs.

, , , , , , , , и . ATS, стр. 1-6. IEEE, (2023)

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Said Hamdioui

Said Es-Said

Said Al-Said

Saroit Anis Said

Nawal Khurshid Said

 

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Efficient Tests for Realistic Faults in Dual-Port SRAMs., и . IEEE Trans. Computers, 51 (5): 460-473 (2002)Computation in Memory for Data-Intensive Applications: Beyond CMOS and beyond Von- Neumann.. SCOPES, стр. 1. ACM, (2015)Applying Thermal Side-Channel Attacks on Asymmetric Cryptography., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 29 (11): 1930-1942 (2021)RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems., , , , , , , , , и 8 other автор(ы). CoRR, (2019)A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs., , , , , , и . DATE, стр. 792-797. IEEE, (2020)Memristor based memories: Technology, design and test., , и . DTIS, стр. 1-7. IEEE, (2014)BTI impact on SRAM sense amplifier., , и . IDT, стр. 1-6. IEEE, (2013)ECC design for fault-tolerant crossbar memories: A case study., , и . IDT, стр. 61-66. IEEE, (2010)Memristive devices for computation-in-memory., , , , и . DATE, стр. 1646-1651. IEEE, (2018)March SL: A Test For All Static Linked Memory Faults., , , и . Asian Test Symposium, стр. 372-377. IEEE Computer Society, (2003)