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A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs., , , , , , and . DATE, page 792-797. IEEE, (2020)Memristive Devices for Computation-In-Memory., , , , and . CoRR, (2019)Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests., , , , and . CoRR, (2020)RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems., , , , , , , , , and 8 other author(s). CoRR, (2019)Applying Thermal Side-Channel Attacks on Asymmetric Cryptography., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 29 (11): 1930-1942 (2021)Memristor-Based Lightweight Encryption., , , , , , and . DSD, page 634-641. IEEE, (2023)Smart Redundancy Schemes for ANNs Against Fault Attacks., , and . ETS, page 1-2. IEEE, (2022)A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs., , , , and . Microelectron. Reliab., (2018)Characterization and Test of Intermittent Over RESET in RRAMs., , , , , , , , and . ATS, page 1-6. IEEE, (2023)Memristive devices for computation-in-memory., , , , and . DATE, page 1646-1651. IEEE, (2018)