%0 Conference Paper %1 conf/ats/LinCH09 %A Lin, Jin-Fu %A Chang, Soon-Jyh %A Huang, Chih-Hao %B Asian Test Symposium %D 2009 %I IEEE Computer Society %K dblp %P 57-62 %T Design-for-Test Circuit for the Reduced Code Based Linearity Test Method in Pipelined ADCs with Digital Error Correction Technique. %U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#LinCH09 %@ 978-0-7695-3864-8

@inproceedings{conf/ats/LinCH09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Lin, Jin-Fu and Chang, Soon-Jyh and Huang, Chih-Hao}, biburl = {https://www.bibsonomy.org/bibtex/24168c0470382854ff7119262027f86e0/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.18}, interhash = {960bc60798e8f287f3dc015d265af898}, intrahash = {4168c0470382854ff7119262027f86e0}, isbn = {978-0-7695-3864-8}, keywords = {dblp}, pages = {57-62}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:09.000+0200}, title = {Design-for-Test Circuit for the Reduced Code Based Linearity Test Method in Pipelined ADCs with Digital Error Correction Technique.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#LinCH09}, year = 2009 }