Article,
Failure signatures on 0.25 μm GaN HEMTs for high-power RF applications.
A. Stocco, S. Dalcanale, F. Rampazzo, M. Meneghini, G. Meneghesso, J. Grünenpütt, B. Lambert, H. Blanck, and E. Zanoni.Microelectron. Reliab., 54 (9-10): 2237-2241 (2014)
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- 2014
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- Microelectron. Reliab.
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- 9-10
- pages
- 2237-2241
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- https://doi.org/10.1016/j.microrel.2014.07.075
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%1 journals/mr/StoccoDRMMGLBZ14
%A Stocco, Antonio
%A Dalcanale, Stefano
%A Rampazzo, Fabiana
%A Meneghini, Matteo
%A Meneghesso, Gaudenzio
%A Grünenpütt, Jan
%A Lambert, Benoit
%A Blanck, Hervé
%A Zanoni, Enrico
%D 2014
%J Microelectron. Reliab.
%K dblp
%N 9-10
%P 2237-2241
%T Failure signatures on 0.25 μm GaN HEMTs for high-power RF applications.
%U http://dblp.uni-trier.de/db/journals/mr/mr54.html#StoccoDRMMGLBZ14
%V 54
@article{journals/mr/StoccoDRMMGLBZ14,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Stocco, Antonio and Dalcanale, Stefano and Rampazzo, Fabiana and Meneghini, Matteo and Meneghesso, Gaudenzio and Grünenpütt, Jan and Lambert, Benoit and Blanck, Hervé and Zanoni, Enrico},
biburl = {https://www.bibsonomy.org/bibtex/24e3376738cc5b139d00a59f8ce6a4116/dblp},
ee = {https://doi.org/10.1016/j.microrel.2014.07.075},
interhash = {aee4d8401b51e40cbc29d2d9e3f6206c},
intrahash = {4e3376738cc5b139d00a59f8ce6a4116},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-10},
pages = {2237-2241},
timestamp = {2024-05-13T07:47:56.000+0200},
title = {Failure signatures on 0.25 μm GaN HEMTs for high-power RF applications.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#StoccoDRMMGLBZ14},
volume = 54,
year = 2014
}