%0 Conference Paper %1 conf/ats/YamaguchiWMF01 %A ichi Yamaguchi, Ken %A Wada, Hiroki %A Masuzawa, Toshimitsu %A Fujiwara, Hideo %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 313-318 %T BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#YamaguchiWMF01 %@ 0-7695-1378-6

@inproceedings{conf/ats/YamaguchiWMF01, added-at = {2023-03-24T00:00:00.000+0100}, author = {ichi Yamaguchi, Ken and Wada, Hiroki and Masuzawa, Toshimitsu and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2315f838f564b50dc039053f670fb72bd/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990302}, interhash = {c046ad169d58aa8aec998eccae27a55d}, intrahash = {315f838f564b50dc039053f670fb72bd}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {313-318}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#YamaguchiWMF01}, year = 2001 }