%0 Conference Paper %1 conf/delta/InoueIYI10 %A Inoue, Tomoo %A Izumi, Nobukazu %A Yoshikawa, Yuki %A Ichihara, Hideyuki %B DELTA %D 2010 %I IEEE Computer Society %K dblp %P 345-349 %T A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic. %U http://dblp.uni-trier.de/db/conf/delta/delta2010.html#InoueIYI10 %@ 978-0-7695-3978-2

@inproceedings{conf/delta/InoueIYI10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Inoue, Tomoo and Izumi, Nobukazu and Yoshikawa, Yuki and Ichihara, Hideyuki}, biburl = {https://www.bibsonomy.org/bibtex/208935cd84a4672a91bc131d1f121a1e2/dblp}, booktitle = {DELTA}, crossref = {conf/delta/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/DELTA.2010.52}, interhash = {d51ef9a92d52d7af9a3471d7485a8dc6}, intrahash = {08935cd84a4672a91bc131d1f121a1e2}, isbn = {978-0-7695-3978-2}, keywords = {dblp}, pages = {345-349}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T16:16:25.000+0200}, title = {A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic.}, url = {http://dblp.uni-trier.de/db/conf/delta/delta2010.html#InoueIYI10}, year = 2010 }