%0 Journal Article %1 journals/jolpe/JoshiLFDJBG12 %A Joshi, Smriti %A Lombardot, Anne %A Flatresse, Philippe %A D'Agostino, Carmelo %A Juge, Andre %A Beigné, Edith %A Girard, Stéphane %D 2012 %J J. Low Power Electron. %K dblp %N 1 %P 113-124 %T Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations. %U http://dblp.uni-trier.de/db/journals/jolpe/jolpe8.html#JoshiLFDJBG12 %V 8

@article{journals/jolpe/JoshiLFDJBG12, added-at = {2022-01-03T00:00:00.000+0100}, author = {Joshi, Smriti and Lombardot, Anne and Flatresse, Philippe and D'Agostino, Carmelo and Juge, Andre and Beigné, Edith and Girard, Stéphane}, biburl = {https://www.bibsonomy.org/bibtex/235e0773395516f1d516d86871baa5df3/dblp}, ee = {https://doi.org/10.1166/jolpe.2012.1166}, interhash = {d8cb4f3ffc2b6917f25fde2ff33c3cfb}, intrahash = {35e0773395516f1d516d86871baa5df3}, journal = {J. Low Power Electron.}, keywords = {dblp}, number = 1, pages = {113-124}, timestamp = {2024-04-09T01:46:29.000+0200}, title = {Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations.}, url = {http://dblp.uni-trier.de/db/journals/jolpe/jolpe8.html#JoshiLFDJBG12}, volume = 8, year = 2012 }