%0 Conference Paper %1 conf/iolts/MiyakeKKAFMM20 %A Miyake, Yousuke %A Kato, Takaaki %A Kajihara, Seiji %A Aso, Masao %A Futami, Haruji %A Matsunaga, Satoshi %A Miura, Yukiya %B IOLTS %D 2020 %I IEEE %K dblp %P 1-6 %T On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. %U http://dblp.uni-trier.de/db/conf/iolts/iolts2020.html#MiyakeKKAFMM20 %@ 978-1-7281-8187-5

@inproceedings{conf/iolts/MiyakeKKAFMM20, added-at = {2021-04-09T00:00:00.000+0200}, author = {Miyake, Yousuke and Kato, Takaaki and Kajihara, Seiji and Aso, Masao and Futami, Haruji and Matsunaga, Satoshi and Miura, Yukiya}, biburl = {https://www.bibsonomy.org/bibtex/2589741848d57e286fd6b5d9432a85149/dblp}, booktitle = {IOLTS}, crossref = {conf/iolts/2020}, ee = {https://doi.org/10.1109/IOLTS50870.2020.9159717}, interhash = {e89f6cfbb92ab56f5e88f2854352dc22}, intrahash = {589741848d57e286fd6b5d9432a85149}, isbn = {978-1-7281-8187-5}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T10:53:07.000+0200}, title = {On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.}, url = {http://dblp.uni-trier.de/db/conf/iolts/iolts2020.html#MiyakeKKAFMM20}, year = 2020 }