%0 Conference Paper %1 conf/cicc/ChangKMKR05 %A Chang, Ik Joon %A Kang, Kunhyuk %A Mukhopadhyay, Saibal %A Kim, Chris H. %A Roy, Kaushik %B CICC %D 2005 %I IEEE %K dblp %P 439-442 %T Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2005.html#ChangKMKR05 %@ 0-7803-9023-7

@inproceedings{conf/cicc/ChangKMKR05, added-at = {2017-05-17T00:00:00.000+0200}, author = {Chang, Ik Joon and Kang, Kunhyuk and Mukhopadhyay, Saibal and Kim, Chris H. and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/24007115084908b04a237a2294cc90d05/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2005}, ee = {https://doi.org/10.1109/CICC.2005.1568700}, interhash = {e8e0df410317693c9a4a4c136a4aa344}, intrahash = {4007115084908b04a237a2294cc90d05}, isbn = {0-7803-9023-7}, keywords = {dblp}, pages = {439-442}, publisher = {IEEE}, timestamp = {2019-10-17T23:06:40.000+0200}, title = {Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2005.html#ChangKMKR05}, year = 2005 }