Inproceedings,
Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation.
Z. Li, B. Zhu, A. Nath, M. Miao, A. Loiseau, Y. Li, J. Johnson, S. Mitra, and R. Gauthier.IRPS, page 1-4. IEEE, (2020)
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- conf/irps/LiZNMLLJMG20
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2020
- pages
- 1-4
- publisher
- IEEE
- crossref
- conf/irps/2020
- ee
- https://doi.org/10.1109/IRPS45951.2020.9128351
- isbn
- 978-1-7281-3199-3
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2020.html#LiZNMLLJMG20
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%1 conf/irps/LiZNMLLJMG20
%A Li, Zhiqing
%A Zhu, Baofu
%A Nath, Anindya
%A Miao, Meng
%A Loiseau, Alain
%A Li, You
%A Johnson, Jeffrey B.
%A Mitra, Souvick
%A Gauthier, Robert
%B IRPS
%D 2020
%I IEEE
%K dblp
%P 1-4
%T Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation.
%U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#LiZNMLLJMG20
%@ 978-1-7281-3199-3
@inproceedings{conf/irps/LiZNMLLJMG20,
added-at = {2024-10-06T00:00:00.000+0200},
author = {Li, Zhiqing and Zhu, Baofu and Nath, Anindya and Miao, Meng and Loiseau, Alain and Li, You and Johnson, Jeffrey B. and Mitra, Souvick and Gauthier, Robert},
biburl = {https://www.bibsonomy.org/bibtex/23bffd51e4c92f6e596222de71ca6923d/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2020},
ee = {https://doi.org/10.1109/IRPS45951.2020.9128351},
interhash = {f3492aae1e3348d5e93f1d74cda3d322},
intrahash = {3bffd51e4c92f6e596222de71ca6923d},
isbn = {978-1-7281-3199-3},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2024-10-07T09:55:11.000+0200},
title = {Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#LiZNMLLJMG20},
year = 2020
}