%0 Conference Paper %1 conf/isqed/KanjJKKMRNN09 %A Kanj, Rouwaida %A Joshi, Rajiv V. %A Kuang, Jente B. %A Kim, J. %A Meterelliyoz, Mesut %A Reohr, William R. %A Nassif, Sani R. %A Nowka, Kevin J. %B ISQED %D 2009 %I IEEE Computer Society %K dblp %P 190-194 %T Statistical yield analysis of silicon-on-insulator embedded DRAM. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2009.html#KanjJKKMRNN09 %@ 978-1-4244-2952-3

@inproceedings{conf/isqed/KanjJKKMRNN09, added-at = {2024-10-06T00:00:00.000+0200}, author = {Kanj, Rouwaida and Joshi, Rajiv V. and Kuang, Jente B. and Kim, J. and Meterelliyoz, Mesut and Reohr, William R. and Nassif, Sani R. and Nowka, Kevin J.}, biburl = {https://www.bibsonomy.org/bibtex/2e72f5cc8961a38d520ef8fdf72c1998c/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISQED.2009.4810292}, interhash = {fa39aa81e94468bb16d952ab8fa707cb}, intrahash = {e72f5cc8961a38d520ef8fdf72c1998c}, isbn = {978-1-4244-2952-3}, keywords = {dblp}, pages = {190-194}, publisher = {IEEE Computer Society}, timestamp = {2024-10-07T09:36:09.000+0200}, title = {Statistical yield analysis of silicon-on-insulator embedded DRAM.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2009.html#KanjJKKMRNN09}, year = 2009 }