%0 Journal Article %1 journals/corr/abs-2311-11439 %A Ridder, Vic De %A Dey, Bappaditya %A Blanco, Víctor %A Halder, Sandip %A Waeyenberge, Bartel Van %D 2023 %J CoRR %K dblp %T Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. %U http://dblp.uni-trier.de/db/journals/corr/corr2311.html#abs-2311-11439 %V abs/2311.11439

@article{journals/corr/abs-2311-11439, added-at = {2023-11-23T00:00:00.000+0100}, author = {Ridder, Vic De and Dey, Bappaditya and Blanco, Víctor and Halder, Sandip and Waeyenberge, Bartel Van}, biburl = {https://www.bibsonomy.org/bibtex/2be7449adffcad8f78363d3de7e9ee320/dblp}, ee = {https://doi.org/10.48550/arXiv.2311.11439}, interhash = {bf1833051dac6506b785c91da0b80d9e}, intrahash = {be7449adffcad8f78363d3de7e9ee320}, journal = {CoRR}, keywords = {dblp}, timestamp = {2024-04-09T00:27:33.000+0200}, title = {Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.}, url = {http://dblp.uni-trier.de/db/journals/corr/corr2311.html#abs-2311-11439}, volume = {abs/2311.11439}, year = 2023 }