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Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.

V. Ridder, B. Dey, V. Blanco, S. Halder, and B. Waeyenberge. CoRR, (2023)

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Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Dhomse

Other publications of authors with the same name

A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection.E. Dehaerne, B. Dey, and S. Halder. ICECS 2022, page 1-2. IEEE, (2022)SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering.M. Hwang, B. Dey, E. Dehaerne, S. Halder, and Y. han Shin. CoRR, (2023)Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.V. Ridder, B. Dey, V. Blanco, S. Halder, and B. Waeyenberge. CoRR, (2023)Using Unsupervised Machine Learning for Plasma Etching Endpoint Detection.I. Chakroun, T. Ashby, S. Das, S. Halder, R. Wuyts, and W. Verachtert. ICPRAM, page 273-279. SCITEPRESS, (2020)Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE.S. Sacchi, B. Dey, I. Mochi, S. Halder, and P. Leray. CoRR, (2023)Optimizing YOLOv7 for Semiconductor Defect Detection.E. Dehaerne, B. Dey, S. Halder, and S. Gendt. CoRR, (2023)Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization.E. Dehaerne, B. Dey, S. Halder, and S. Gendt. CoRR, (2023)In-line metrology and inspection for process control during 3D stacking of IC's.S. Halder, I. Wolf, A. Phommahaxay, A. Miller, M. Maenhoudt, G. Beyer, B. Swinnen, and E. Beyne. 3DIC, page 1-4. IEEE, (2011)Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS.Y. Chen, J. Deforce, V. Ridder, B. Dey, V. Blanco, S. Halder, and P. Leray. CoRR, (2024)

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Disambiguation of "Halder, Sandip"

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URL
DOI
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Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.

Please choose a person to relate this publication to

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Dhomse

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Halder, Sandip"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.

Please choose a person to relate this publication to

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Dhomse

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.