Inproceedings,
Robust Off-State TDDB Reliability of n-LDMOS.
W. Liu, D. Ioannou, J. Kantarovsky, B. Min, and T. Nigam.IRPS, page 26-1. IEEE, (2022)
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- BibTeX key
- conf/irps/LiuIKMN22
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2022
- pages
- 26-1
- publisher
- IEEE
- crossref
- conf/irps/2022
- ee
- https://doi.org/10.1109/IRPS48227.2022.9764573
- isbn
- 978-1-6654-7950-9
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LiuIKMN22
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- please select -%0 Conference Paper
%1 conf/irps/LiuIKMN22
%A Liu, Wen
%A Ioannou, Dimitris P.
%A Kantarovsky, Johnatan
%A Min, Byoung
%A Nigam, Tanya
%B IRPS
%D 2022
%I IEEE
%K dblp
%P 26-1
%T Robust Off-State TDDB Reliability of n-LDMOS.
%U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LiuIKMN22
%@ 978-1-6654-7950-9
@inproceedings{conf/irps/LiuIKMN22,
added-at = {2022-05-09T00:00:00.000+0200},
author = {Liu, Wen and Ioannou, Dimitris P. and Kantarovsky, Johnatan and Min, Byoung and Nigam, Tanya},
biburl = {https://www.bibsonomy.org/bibtex/2bf12f03bcf4e5ce9e516e345e0daf240/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2022},
ee = {https://doi.org/10.1109/IRPS48227.2022.9764573},
interhash = {3a562d0abce319606c15c6f0d3a5e328},
intrahash = {bf12f03bcf4e5ce9e516e345e0daf240},
isbn = {978-1-6654-7950-9},
keywords = {dblp},
pages = {26-1},
publisher = {IEEE},
timestamp = {2024-04-09T12:18:58.000+0200},
title = {Robust Off-State TDDB Reliability of n-LDMOS.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LiuIKMN22},
year = 2022
}