%0 Conference Paper %1 conf/ets/WuRMTMYCHK19 %A Wu, Lizhou %A Rao, Siddharth %A Medeiros, Guilherme Cardoso %A Taouil, Mottaqiallah %A Marinissen, Erik Jan %A Yasin, Farrukh %A Couet, Sebastien %A Hamdioui, Said %A Kar, Gouri Sankar %B ETS %D 2019 %I IEEE %K dblp %P 1-6 %T Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. %U http://dblp.uni-trier.de/db/conf/ets/ets2019.html#WuRMTMYCHK19 %@ 978-1-7281-1173-5

@inproceedings{conf/ets/WuRMTMYCHK19, added-at = {2024-05-07T00:00:00.000+0200}, author = {Wu, Lizhou and Rao, Siddharth and Medeiros, Guilherme Cardoso and Taouil, Mottaqiallah and Marinissen, Erik Jan and Yasin, Farrukh and Couet, Sebastien and Hamdioui, Said and Kar, Gouri Sankar}, biburl = {https://www.bibsonomy.org/bibtex/2e6ad670f69ef7e9f37cf081129a2661d/dblp}, booktitle = {ETS}, crossref = {conf/ets/2019}, ee = {https://doi.org/10.1109/ETS.2019.8791518}, interhash = {80972c6d2f6b7379856ec1563c6ad8a0}, intrahash = {e6ad670f69ef7e9f37cf081129a2661d}, isbn = {978-1-7281-1173-5}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-05-13T10:05:03.000+0200}, title = {Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2019.html#WuRMTMYCHK19}, year = 2019 }