%0 Conference Paper %1 conf/vts/AmrouchCJKKKPST21 %A Amrouch, Hussam %A Chowdhury, Animesh Basak %A Jin, Wentian %A Karri, Ramesh %A Khorrami, Farshad %A Krishnamurthy, Prashanth %A Polian, Ilia %A van Santen, Victor M. %A Tan, Benjamin %A Tan, Sheldon X.-D. %B VTS %D 2021 %I IEEE %K dblp %P 1-11 %T Special Session: Machine Learning for Semiconductor Test and Reliability. %U http://dblp.uni-trier.de/db/conf/vts/vts2021.html#AmrouchCJKKKPST21 %@ 978-1-6654-1949-9

@inproceedings{conf/vts/AmrouchCJKKKPST21, added-at = {2023-11-12T00:00:00.000+0100}, author = {Amrouch, Hussam and Chowdhury, Animesh Basak and Jin, Wentian and Karri, Ramesh and Khorrami, Farshad and Krishnamurthy, Prashanth and Polian, Ilia and van Santen, Victor M. and Tan, Benjamin and Tan, Sheldon X.-D.}, biburl = {https://www.bibsonomy.org/bibtex/20dc973a1de11f39c6b3f46eace5c4dad/dblp}, booktitle = {VTS}, crossref = {conf/vts/2021}, ee = {https://doi.org/10.1109/VTS50974.2021.9441052}, interhash = {e497b6971d00a4faedec1ec3f4c9ddf8}, intrahash = {0dc973a1de11f39c6b3f46eace5c4dad}, isbn = {978-1-6654-1949-9}, keywords = {dblp}, pages = {1-11}, publisher = {IEEE}, timestamp = {2024-04-09T23:55:35.000+0200}, title = {Special Session: Machine Learning for Semiconductor Test and Reliability.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2021.html#AmrouchCJKKKPST21}, year = 2021 }