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Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching.

, , , and . Conf. Computing Frontiers, page 129-138. ACM, (2008)

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Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead., , , , and . IEEE Des. Test, 37 (4): 35-41 (2020)An industrial case study of analog fault modeling., , and . VTS, page 178-183. IEEE Computer Society, (2011)Built-in self-test and characterization of polar transmitter parameters in the loop-back mode., , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components., and . VTS, page 1-7. IEEE, (2022)Block-Based Test Integration for Analog Integrated Circuits., and . LATW, page 128-132. IEEE, (2000)Zero-overhead self test and calibration of RF transceivers., , and . ITC, page 1-9. IEEE Computer Society, (2013)Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation., , , and . PACT, page 424. IEEE Computer Society, (2007)Adaptive test flow for mixed-signal/RF circuits using learned information from device under test., , and . ITC, page 674-683. IEEE Computer Society, (2010)Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown., , and . DATE, page 300-305. IEEE Computer Society, (2005)Detecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS., , , , , and . ICASSP, page 8296-8300. IEEE, (2019)